Panelists for Year In Review Expert Discussion Revealed

Panelists for Year In Review Expert Discussion RevealedThe panelists for FindBiometrics’ first webinar of the year have been announced, and they’re a strong set.

Slated for 11 AM Eastern on Wednesday, January 24th, 2018’s first expert discussion is actually a look back on 2017, assessing the remarkable results of FindBiometrics’ annual Year in Review survey. FindBiometrics President Peter O’Neill will kickstart the talk together with Leidos VP and Tech Fellow John Mears, analyzing the results of the industry-focused webinar.

From there, they’ll turn to their expert panel:

  • John Schneider, Senior Technology Director of Qualcomm (and former President and CTO of Ultrascan);
  • Arun Vemury, the Director of the Department of Homeland Security Science and Technology’s Biometrics Technology Engine;
  • Paul Hunter, US Citizenship and Immigration Services’ Chief of Biometrics Strategy

The panel comprises some serious expertise in heavy-duty biometric technologies across the consumer and government sectors, and should have some interesting things to say about FindBiometrics’ Year in Review survey results.

Registration for the webinar is open now, and it’s free to sign up – be sure to reserve your ‘seat’ so that you’ll be prompted join when the discussion is about to get underway.

After you’ve signed up, check out our Year in Review coverage highlights:

Year in Review 2017: Introduction From John Mears, Vice President and Tech Fellow, Leidos

Year in Review 2017: The Most Exciting Modalities, Part 1

Year in Review 2017: Most Exciting Modalities, Part 2

Year in Review 2017: NuData VP Ryan Wilk Outlines the Ascent of Passive Biometrics

‘Face is the Future’: Our Year in Review Interview with NEC North America’s Raffie Beroukhim

Year in Review: BioCatch’s Frances Zelazny on Behavioral Biometrics in 2017