“The recognition of MorphoWave in three categories demonstrates our technology leadership in contactless fingerprint captures.” – Ed Casey, CEO of IDEMIA’s North American Identity & Security Business Unit
IDEMIA announced a biometric hat trick for its contactless fingerprint scanner MorphoWave, scoring an award in three categories in The Intelligence Advanced Research Projects Activity (IARPA) Nail to Nail (N2N) Fingerprint Challenge. MorphoWave made its mark as the only solution to be awarded in the categories of Fastest Scan, Best Gallery Accuracy, and Best Latent Accuracy. It was recognized by IARPA as one of the top three performing solutions in the challenge.
The N2N Fingerprint Challenge’s goal is to improve nail-to-nail rolled fingerprint capture technology and eliminate the need for human operators to roll fingerprints, with various companies vying for first place. MorphoWave captures fingerprints without contact of any capture platen or flat surface. The contact-free tech stands out for its ability to cope with dry and wet fingers, eliminate residual ghost images, and for being arguably more hygienic than touch sensors. This frictionless end user experience eliminates the need for fingerprint rolling. Additionally, the MorphoWave was noted for its performance between speed, rolled tenprint matching accuracy, and latent print matching accuracy.
“It is an honor for IDEMIA to receive these awards from IARPA,” said Ed Casey, CEO of IDEMIA’s North American Identity & Security Business Unit. “The recognition of MorphoWave in three categories demonstrates our technology leadership in contactless fingerprint captures. IDEMIA’s commitment to research and development that address our customers’ needs remains our driving force.”
April 2, 2018 – Susan Stover