GALLERY: The Faces of Biometrics at FedID 17

The inaugural Federal Identity Forum & Exposition (FedID 17) took place in Washington D.C. this week and FindBiometrics was there.  FedID is the US government’s flagship outreach and collaboration-building event focused on the identity technology community, and as such, thought leadership, product announcements, and biometric demonstrations characterized the conference formerly known as the Global Identity Summit. FindBiometrics President Peter O’Neill reported from the Walter E. Washington Convention Center where the event took place. Here are some of the industry faces he countered on exhibition floor:

Read more about FedID 17 by following the links below:

FedID: Interview With Green Bit’s Nadia Reid [AUDIO]

OT-Morpho Launches MorphoTop Slim Fingerprint Scanner at FedID

Jenetric Announces Livetouch Quattro Mobile Ahead of FedID 2017

Green Bit to Unveil MultiScan527t at FedID 2017